A Bayesian Deep Neural Network with MC Dropout for Multi-stage Quality Prediction
DOI: 10.23977/ieim.2026.090112 | Downloads: 1 | Views: 47
Author(s)
Manli Liu 1, Wenhan Fu 1,2, Junxiang Li 1,2, Qiuyang Wang 1
Affiliation(s)
1 Business School, University of Shanghai for Science and Technology, Shanghai, 200093, China
2 School of Intelligent Emergency Management, University of Shanghai for Science and Technology, Shanghai, 200093, China
Corresponding Author
Wenhan FuABSTRACT
To address the challenges of complex quality evolution mechanisms and the difficulty in characterizing prediction uncertainty in multi-stage manufacturing processes, this study proposes a deep neural network-based multi-stage quality prediction method using MC Dropout for approximate Bayesian inference. First, systematic data preprocessing is performed, with SMOTE used for data augmentation and stage-wise PCA for dimensionality reduction. Subsequently, the Dropout mechanism is incorporated into the deep neural network, and MC Dropout is employed to jointly model the predictive mean and uncertainty. A five-fold cross-validation strategy is adopted for model training and evaluation, and the effectiveness of the proposed method is validated using real-world TFT-LCD manufacturing data. Experimental results demonstrate that the proposed method achieves superior prediction accuracy while providing uncertainty estimates for multi-stage quality prediction.
KEYWORDS
Multi-stage quality prediction; Deep neural network; MC Dropout; Bayesian inference; Uncertainty modelingCITE THIS PAPER
Manli Liu, Wenhan Fu, Junxiang Li, Qiuyang Wang. A Bayesian Deep Neural Network with MC Dropout for Multi-stage Quality Prediction. Industrial Engineering and Innovation Management (2026). Vol. 9, No. 1, 105-112. DOI: http://dx.doi.org/10.23977/ieim.2026.090112.
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