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Simulation Test of Electronic Door Lock and Doorbell Circuit Based on 74 Series Chip

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DOI: 10.23977/jeis.2022.070206 | Downloads: 8 | Views: 131

Author(s)

Runle Yu 1, Xinda Shen 1, Xiaoyan Jiang 1

Affiliation(s)

1 Department of Electrical Information, Shandong University of Science and Technology, Qingdao, Shandong, 250000, China

Corresponding Author

Runle Yu

ABSTRACT

In this paper, the electronic combination lock circuit is simulated and tested using Multisim software. The paper begins by presenting the overall circuit. After that, the individual modules are tested separately, which include the password input module, the timing module, the display module and the alarm module. The test results were as expected and the tests passed. Finally, the paper makes suggestions for improvements to this system.

KEYWORDS

Electronic lock, Multisim

CITE THIS PAPER

Runle Yu, Xinda Shen, Xiaoyan Jiang, Simulation Test of Electronic Door Lock and Doorbell Circuit Based on 74 Series Chip. Journal of Electronics and Information Science (2022) Vol. 7: 34-38. DOI: http://dx.doi.org/10.23977/jeis.2022.070206.

REFERENCES

[1] XIE Song-min. Design of remote virtual laboratory based on LabVIEW and Multisim electronic Circuit [D]. Hunan Normal University,2015.
[2] Yang Rui, Wang Xiaoyan, Yang Ting. Construction of Electrical and Electronic Laboratory Based on Multisim Virtual Simulation Technology [J]. Experimental technology and management,2015,32(10):129-131.
[3] FU Yang. Application of Multisim Simulation in electrical and electronic experiment [J]. Laboratory research & exploration, 2011,30(04):120-122+126.

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