Education, Science, Technology, Innovation and Life
Open Access
Sign In

Simulation Test of Electronic Door Lock and Doorbell Circuit Based on 74 Series Chip

Download as PDF

DOI: 10.23977/jeis.2022.070206 | Downloads: 30 | Views: 936


Runle Yu 1, Xinda Shen 1, Xiaoyan Jiang 1


1 Department of Electrical Information, Shandong University of Science and Technology, Qingdao, Shandong, 250000, China

Corresponding Author

Runle Yu


In this paper, the electronic combination lock circuit is simulated and tested using Multisim software. The paper begins by presenting the overall circuit. After that, the individual modules are tested separately, which include the password input module, the timing module, the display module and the alarm module. The test results were as expected and the tests passed. Finally, the paper makes suggestions for improvements to this system.


Electronic lock, Multisim


Runle Yu, Xinda Shen, Xiaoyan Jiang, Simulation Test of Electronic Door Lock and Doorbell Circuit Based on 74 Series Chip. Journal of Electronics and Information Science (2022) Vol. 7: 34-38. DOI:


[1] XIE Song-min. Design of remote virtual laboratory based on LabVIEW and Multisim electronic Circuit [D]. Hunan Normal University,2015.
[2] Yang Rui, Wang Xiaoyan, Yang Ting. Construction of Electrical and Electronic Laboratory Based on Multisim Virtual Simulation Technology [J]. Experimental technology and management,2015,32(10):129-131.
[3] FU Yang. Application of Multisim Simulation in electrical and electronic experiment [J]. Laboratory research & exploration, 2011,30(04):120-122+126.

Downloads: 8294
Visits: 280085

Sponsors, Associates, and Links

All published work is licensed under a Creative Commons Attribution 4.0 International License.

Copyright © 2016 - 2031 Clausius Scientific Press Inc. All Rights Reserved.