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Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters

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DOI: 10.23977/icamcs.2017.1028


Qin Weiwei, Sin Saiweng, U Sengpan, Martins RuiPaulo

Corresponding Author

Qin WeiWei


This paper describes an automated test system for Analog to Digital Converters (ADC) combining various instruments controlled by LabVIEW, to implement standard-based real-time measurement which accurately characterizes the statistical and dynamic performances. Moreover, the proposed system provides an automated input parameter sweep-function, which realizes the ADC intelligent automation test with different input settings. Virtual Instruments (VIs) were created in system program to control signal generation and data acquisition. The system is not limited to the type or speed of the ADC under test due to its high compatibility and hardware modularity. We describe in detail the hardware arrangement and software programming, as well as the experimental testing of real ADCs, to demonstrate system’s performance.


Analog to Digital Converter, Test System, Automated, Sweep Function, LabVIEW.

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