Education, Science, Technology, Innovation and Life
Open Access
Sign In

Journal of Integrated Circuits Design and Test

ISSN 2523-9139

Aims & Scope

The journal promotes and expedites the dissemination of new research results.There is an exciting and large volume of research activity in the field worldwide.The goal of this journal is to provide a platform for academicians and scientists all over the world to share, promote, and discuss various new issues and developments in different areas of integrated circuits design and test.

All manuscripts must be prepared in English and are subject to a rigorous and fair peer-review process. Generally, accepted papers will appear online within 3 weeks followed by printed hard copy. The journal publishes original papers including but not limited to the following fields:

Digital integrated circuits and signal processing
Processors/ multiprocessors
Memory design
Analog and mixed-signal circuits
RF integrated circuits and microwave engineering
Circuit technologies
Design experience with advanced design technologies
Circuits/devices modeling, verification and testing
Reconfigurable architectures & FPGA-based designs
Embedded systems design
IoT related circuits, devices and applications
Rebooting computing

Downloads: 0
Visits: 0

Sponsors, Associates, and Links

All published work is licensed under a Creative Commons Attribution 4.0 International License.

Copyright © 2016 - 2031 Clausius Scientific Press Inc. All Rights Reserved.